Condon P, Espuny Díaz A, Kühn D, Osthus D, Kim J. Resilient Degree Sequences with respect to Hamilton Cycles and Matchings in Random Graphs. Electron. J. Combin. [Internet]. 2019Dec.20 [cited 2026Mar.17];26(4):P4.54. Available from: https://www.combinatorics.org/ojs/index.php/eljc/article/view/v26i4p54